1 publication

• Published Subscription 16 Jul 2016

  Deposition and Characterization of ZnO Thin Films by Thermal Vacuum Thermal Evaporation Method for Photoconductive Sensor Application

  By Arun Dev Dhar Dwivedi, Sumit Vyas, Shaivalini Singh

  Abstract: In this work we have deposited ZnO thin films using thermal evaporation method. The films have been deposited on silicon substrate for structural characterization and on glass substrate for optical characterization. The structural, surface morphology, optical properties and electrical properties of ZnO thin films were investigated systematically using X-ray diffractometer (XRD), scanning electron microscope (SEM), atomic force microscopy (AFM), ellipsometeric measurement and semiconductor parameter analyzer respectively. The deposited ZnO thin …

  Published in International Journal of Microelectronics and Digital integrated circuits · Vol. 2, Issue 1, 2016 · pp. 1–7 Read article →